Anzeige
Sortierung
Seite 7 von 7

1

X-ray diffraction characterization of polycrystalline InP films grown by molecular-beam deposition: Estimation of stacking-fault probability

Autoren:
Kajikawa, Y.; Iseki, Y.; Matsui, Y.
Konferenz:
IPRM 2011 - 23th International Conference on Indium Phosphide and Related Materials