IEC 62899-402-1:2017
Printed electronics - Part 402-1: Printability - Measurement of qualities - Pattern width
Ausgabedatum:
2017-03
Edition:
1.0
Sprache: EN - englisch
Seitenzahl: 12 VDE-Artnr.: 224306
IEC 62899-402-1:2017(E) specifies the measurement methods of the widths of the printed patterns in printed electronics. These printed pattern widths are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for thickness in printed electronics.