IEC 60368-1:2000/AMD1:2004

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

IEC 61337-2:2004

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

IEC 61338-2:2004

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

IEC 60444-7:2004

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

IEC 60862-3:2003

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

IEC 60122-1:2002

Quartz crystal units of assessed quality - Part 1: Generic specification

IEC 60368-4-1:2000

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

IEC 60368-4:2000

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

IEC 60368-1:2000

Piezoelectric filters of assessed quality - Part 1: Generic specification

IEC 61338-1-3:1999

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

IEC 60444-1:1986/AMD1:1999

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

IEC 60679-5-1:1998

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

IEC 60679-5:1998

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

IEC 60679-4-1:1998

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

IEC 60679-4:1997

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

IEC 60368-2-2:1996

Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters

IEC 60444-5:1995

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

IEC 61261-1:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

IEC 61261-2:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

IEC 61261-2-1:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E