IEC 60747-5-7:2016Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
150.00 €
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IEC 62047-26:2016Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
190.00 €
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IEC 62047-1:2016Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
235.00 €
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IEC 62047-16:2015Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
40.00 €
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IEC 62047-17:2015Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
190.00 €
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IEC 62047-20:2014Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
300.00 €
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IEC 62047-21:2014Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
80.00 €
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IEC 62047-22:2014Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates
40.00 €
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IEC 62047-11:2013Semiconductor devices - Micro-electromechanical devices - Part 11: Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
115.00 €
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IEC 62047-18:2013Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials
80.00 €
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IEC 62047-19:2013Semiconductor devices - Micro-electromechanical devices - Part 19: Electronic compasses
190.00 €
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IEC 60747-16-5:2013Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
270.00 €
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IEC TR 62258-4:2012Semiconductor die products - Part 4: Questionnaire for die users and suppliers
115.00 €
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IEC 62047-5:2011/COR1:2012Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS switches
0.00 €
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IEC 62047-9:2011/COR1:2012Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS
0.00 €
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IEC 62047-13:2012Semiconductor devices - Micro-electromechanical devices - Part 13: Bend - and shear - type test methods of measuring adhesive strength for MEMS structures
80.00 €
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IEC 62047-14:2012Semiconductor devices - Micro-electromechanical devices - Part 14: Forming limit measuring method of metallic film materials
115.00 €
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IEC 62047-10:2011/COR1:2012Corrigendum 1 - Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
0.00 €
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IEC 62047-12:2011Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
190.00 €
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IEC 62047-10:2011Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
40.00 €
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