IEC TR 61967-4-1:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 O/150 O direct coupling method - Application guidance to IEC 61967-4

IEC 60747-16-10:2004

Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

IEC 60748-23-5:2003

Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval

IEC 61967-5:2003

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

IEC 61967-6:2002

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

IEC 60748-23-2:2002

Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

IEC 60748-23-3:2002

Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report

IEC 60748-23-4:2002

Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification

IEC 60748-23-1:2002

Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification

IEC 60748-1:2002

Semiconductor devices - Integrated circuits - Part 1: General

IEC 60748-2-12:2001

Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)

IEC TS 61945:2000

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

IEC TS 61944:2000

Integrated circuits - Manufacturing line approval - Demonstration vehicles

IEC 61964:1999

Integrated circuits - Memory devices pin configurations

IEC 60748-11:1990/AMD2:1999

Amendment 2 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

IEC 60748-2-11:1999

Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory

IEC 61943:1999

Integrated circuits - Manufacturing line approval application guideline

IEC 60748-2:1997

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits

IEC 60748-5:1997

Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits

IEC 60748-4:1997

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits