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IEC 60749-37:2022

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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150.00 € 

IEC 60749-37:2022 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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195.00 € 

IEC 60749-10:2022

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly

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75.00 € 

IEC 60749-28:2022

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

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260.00 € 

IEC 60749-28:2022 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

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338.00 € 

IEC 60749-39:2021

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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75.00 € 

IEC 60749-39:2021 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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98.00 € 

IEC 60749-20:2020

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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185.00 € 

IEC 60749-20:2020 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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241.00 € 

IEC 60749-30:2020

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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75.00 € 

IEC 60749-30:2020 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

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98.00 € 

IEC 60749-41:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

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150.00 € 

IEC 60749-15:2020 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

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52.00 € 

IEC 60749-15:2020

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

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40.00 € 

IEC 60749-20-1:2019 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

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338.00 € 

IEC 60749-20-1:2019

Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

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260.00 € 

IEC 60749-18:2019 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

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195.00 € 

IEC 60749-18:2019

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

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150.00 € 

IEC 60749-17:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

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40.00 € 

IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

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75.00 €