Cover E DIN EN IEC 61788-22-3 VDE 0390-22-3:2020-08

E DIN EN IEC 61788-22-3 VDE 0390-22-3:2020-08

* German Language Version *


Part 22-3: Superconducting strip photon detector – dark count rate

(IEC 90/446/CD:2019); Text in German and English
Class/Status: Draft, valid
Released: 2020-08   Published: 2020-07-31
VDE Art. No.: 1300117
End of objection deadline: 2020-09-30

This International Standard / This part of IEC 61788-22-3 is applicable to the measurement of dark count rate (DCR, RD) of superconducting strip photon detectors (SSPDs). For photon detection, at least one dimension of a superconductor line should be within the nanoscale. An example of the strip structure is a thickness of 5 nm, a width of 100 nm and a length of 0,5 mm to cover a sensitive area of 100 µm2 with 100 nm line and space, when it is a simple meander line.