IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Circulation Date:
1980-01
Edition:
1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 18 VDE Artno.: 202820
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.