Cover IEC 60512-25-6:2004
größer

IEC 60512-25-6:2004

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Circulation Date: 2004-05
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 35 VDE Artno.: 211397

Content

Describes methods for measuring an eye pattern response and jitter in the time domain.