Cover IEC 62899-503-1:2020
größer

IEC 62899-503-1:2020

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor

Circulation Date: 2020-05
Edition: 1.0
Language: EN - english
Seitenzahl: 15 VDE Artno.: 248780

Content

IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).