Cover IEC TS 62607-6-11:2022
größer

IEC TS 62607-6-11:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

Circulation Date: 2022-02
Edition: 1.0
Language: EN - english
Seitenzahl: 27 VDE Artno.: 250682

Content

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy