IEC TS 62607-6-26:2025
Nanomanufacturing - Key control characteristics - Part 6-26: Graphene-related products - Fracture strain and stress, Young’s modulus, residual strain and residual stress: bulge test
Circulation Date:
2025-12
Edition:
1.0
Language: EN - english
Seitenzahl: 26 VDE Artno.: 255707
IEC TS 62607-6-26:2025, which is a Technical Specification, establishes a standardized method to determine the mechanical key control characteristics (KCCs)
• Young's modulus (or elastic modulus),
• residual strain,
• residual stress, and
• fracture stress
of 2D materials and nanoscale films using the
• bulge test.
The bulge test is a reliable method where a pressure differential is applied to a freestanding film, and the resulting deformation is measured to derive the mechanical properties.
• This method is applicable to a wide range of freestanding 2D materials, such as graphene, and nanometre-thick films with thicknesses typically ranging from 1 nm to several hundred nanometres.
• This document ensures the characterization of mechanical properties essential for assessing the structural integrity and performance of materials in applications such as composite additives, flexible electronics, and energy harvesting devices.