IEC 63541:2025

Lithium tantalate and lithium niobate crystals for surface acoustic wave (SAW) device applications - Specifications and measuring methods

IEC 60122-2:2025

Quartz crystal units of assessed quality - Part 2: Guidelines for the use

IEC 62276:2025

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

IEC TS 61994-5:2023

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors

IEC TS 61994-5:2023 RLV

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors

IEC 62604-2:2022

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

IEC 62604-2:2022 RLV

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

IEC 62604-1:2022

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

IEC 62604-1:2022 RLV

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

IEC 63041-1:2021 RLV

Piezoelectric sensors - Part 1: Generic specifications

IEC 63041-1:2021

Piezoelectric sensors - Part 1: Generic specifications

IEC 60444-6:2021

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

IEC 60444-6:2021 RLV

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

IEC TS 61994-3:2021

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators

IEC 61837-2:2018+AMD1:2020 CSV (Consolidated Version)

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

IEC 61837-2:2018/AMD1:2020

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

IEC 63041-3:2020

Piezoelectric sensors - Part 3: Physical sensors

IEC 63155:2020

Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications

IEC 62884-4:2019

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

IEC 60122-4:2019

Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors