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IEC 60747-5-4:2022/AMD1:2024

Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

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20.00 € 

IEC 60747-5-4:2022+AMD1:2024 CSV (Consolidated Version)

Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

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465.00 € 

IEC 63378-2-1:2024

Thermal standardization on semiconductor packages - Part 2-1: 3D thermal simulation models of semiconductor packages for steady-state analysis - Discrete packages

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80.00 € 

IEC 60749-5:2023

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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40.00 € 

IEC 60749-5:2023 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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68.00 € 

IEC 63287-2:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

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80.00 € 

IEC 60749-37:2022

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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155.00 € 

IEC 60749-37:2022 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer

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264.00 € 

IEC 62007-1:2015/AMD1:2022

Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

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10.00 € 

IEC 62007-1:2015+AMD1:2022 CSV (Consolidated Version)

Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

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439.99 € 

IEC 60747-5-4:2022

Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

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249.99 € 

IEC 60749-10:2022

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly

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80.00 € 

IEC 60749-28:2022

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

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280.00 € 

IEC 60749-28:2022 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

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476.00 € 

IEC TR 63378-1:2021

Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages

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115.00 € 

IEC 60749-39:2021

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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80.00 € 

IEC 60749-39:2021 RLV

Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

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136.00 € 

IEC 63287-1:2021

Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification

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280.00 € 

IEC 60747-14-11:2021

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

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155.00 € 

IEC 60749-20:2020

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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200.00 €