IEC TS 61994-4-1:2018

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

IEC TS 61994-4-1:2018 RLV

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

IEC 61837-2:2018

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

IEC 62884-3:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

IEC 63041-2:2017

Piezoelectric sensors - Part 2: Chemical and biochemical sensors

IEC 60122-1:2002/AMD1:2017

Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification

IEC 60122-1:2002+AMD1:2017 CSV (Consolidated Version)

Quartz crystal units of assessed quality - Part 1: Generic specification

IEC 62884-2:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

IEC 60679-1:2017

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

IEC 62884-1:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

IEC 60444-8:2016

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

IEC 61240:2016

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

IEC 60758:2016

Synthetic quartz crystal - Specifications and guidelines for use

IEC 62575-1:2015

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

IEC 60862-1:2015

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

IEC 61338-1-5:2015

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

IEC 61837-3:2015

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

IEC 61837-4:2015

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

IEC 62761:2014

Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

IEC 60368-1:2000+AMD1:2004 CSV (Consolidated Version)

Piezoelectric filters of assessed quality - Part 1: Genericspecification