Statistical Simulation - Use of a TRADICA based Statistical Design Kit in the Cadence Environment

Conference: ANALOG '06 - 9. ITG/GMM-Fachtagung
09/27/2006 - 09/29/2006 at Dresden, Germany

Proceedings: ANALOG '06

Pages: 3Language: englishTyp: PDF

Personal VDE Members are entitled to a 10% discount on this title

Wassener, Hans-Joachim; Strobel, Hans-Joachim; Eichel, Dirk; Schneider, Wolfgang (Atmel Germany GmbH)
Schröter, Michael; Wittkopf, Holger (CEDIC TU-Dresden)

For the first time complete statistical models and optimum correlation with process statistics are integrated in a new design kit. This allows yield optimization and design centering measures already in an early phase of IC design.. The model parameters are generated with TRADICA using the geometrical description, process parameters and process statistics for parameter extraction.