Material Characterization of Liquid Crystals at THz-Frequencies using a Free Space Measurement Setup

Conference: GeMIC 2008 - German Microwave Conference
03/10/2008 - 03/12/2008 at Hamburg-Harburg, Germany

Proceedings: GeMIC 2008

Pages: 4Language: englishTyp: PDF

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Koeberle, M.; Mueller, S.; Jakoby, R. (Technische Universität Darmstadt, Wireless Communications Lab, Merckstr. 25, 64283 Darmstadt, Germany)
Göbel, T.; Meissner, P. (Technische Universität Darmstadt, Optical Communications Lab, Merckstr. 25, 64283 Darmstadt, Germany)
Schönherr, D.; Hartnagel, H.-L. (Technische Universität Darmstadt, Microwave Electronics Lab, Merckstr. 25, 64283 Darmstadt, Germany)

Liquid crystals (LCs) are promising materials for passive tunable components at microwave frequencies and optics. With increasing interest in the THz frequency domain the quest on tunable THz components rises. For the systematic design of such tunable components like phase shifters or reflect arrays a detailed knowledge of the dielectric material properties at the intended frequency is needed. In this paper we show measurement results for the characterization of two commercial LCs (K15 and E7, both from Merck) at frequencies between 100 and 350 GHz performed with a free space CW THz system. An anisotropy of DeltanK15 = 0, 05 and DeltanE7 = 0, 08, respectively, could be determined in this frequency range.