Dielectric Profile Measurements with a Time Domain Reflectometry System on the Basis of a Movable Obstacle
Conference: GeMIC 2008 - German Microwave Conference
03/10/2008 - 03/12/2008 at Hamburg-Harburg, Germany
Proceedings: GeMIC 2008
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Will, B.; Schultz, S.; Gerding, M. (Ruhr-University Bochum, Institute of High Frequency Engineering, Bochum, Germany)
Microwave measurement setups for the measurement of the permittivity of soils including the water content of soils and other materials, especially TDR (time domain reflectometry), have become accepted as routine measurement techniques. This summary deals with an advanced use of the TDR principle for the determination of the water content of soil along a probe. The basis of the advanced TDR technique is a waveguide, which is inserted into the material under test for obtaining measurements of the effective permittivity, and an obstacle, which can mechanically be moved along the probe and which acts as a reference reflection for the TDR system with an exactly known position. Based on the known mechanical position of the reference reflection, the measured electrical position can be used as a measure for the effective dielectric constant of the environment. Thus, it is possible to determine the effective dielectric constant with a spatial resolution given by the step size of the obstacle displacement.