STIREEM - A new High Resolution Microwave Imaging Principle
Conference: GeMIC 2008 - German Microwave Conference
03/10/2008 - 03/12/2008 at Hamburg-Harburg, Germany
Proceedings: GeMIC 2008
Pages: 3Language: englishTyp: PDF
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Authors:
Brand, H.; Dexl, A.; Hagen, J.; Kellnberger, S.; Martius, S.; Schmidt, L.-P.; Schür, J.; Weinzierl, J. (Institute for Microwave Technology, University of Erlangen-Nuremberg, Germany)
Abstract:
This paper presents a new principle for electromagnetic imaging that differs from radar and radiometry. By stimulating a target with a modulated signal in a frequency region above conventional microwave wavelengths and measuring the radiation of the target caused by this stimulus in a different frequency band yields a resolution only depending on the spot size of the stimulus. Furthermore a material selectivity can be achieved as the re-emitted signal is affected by the material properties. Three different physical effects are described which can be exploited for the STIREEM principle. First proof of concept measurements are presented and already show the potential of this novel imaging approach.