Robustness Validation – An Improved Qualification Method for Semiconductor Devices in Automotive
Conference: CIPS 2008 - 5th International Conference on Integrated Power Electronics Systems
03/11/2008 - 03/13/2008 at Nuremberg, Germany
Proceedings: CIPS 2008
Pages: 5Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Keller, Helmut (ZVEI, Frankfurt/Main)
Keller, Helmut (International Work Group Robustness Validation, SAE-ZVEIJ-SAE-AEC, Detroit, Frankfurt/Main)
At the beginning of 2005, a joint work group Robustness Validation of Semiconductor Devices in Automotive Applications was formed among representatives from the following institutions: ZVEI, Product Division Electronic Components and Systems (ECS), the SAE (Society of Automotive Engineers) and the JSAE (Japanese SAE). Goal has been to revise the Standard J1879 which dates back of the seventies. The AEC (Automotive Electronic Council) has been included as well. The representatives mainly were from international automotive OEMs, their suppliers and semiconductor manufacturers. The jointly acquired results were published in the Handbook for Robustness Validation of Semiconductor Devices in Automotive Applications in April 2007 and it can be purchased from ZVEI. The handbook clearly elaborates on the change of paradigm away from a stress-based qualification (= „fit for Standard“) to a knowledge-based qualification (= „fit for Application“).