Test System for the Reliability Management of Power Modules

Conference: CIPS 2008 - 5th International Conference on Integrated Power Electronics Systems
03/11/2008 - 03/13/2008 at Nuremberg, Germany

Proceedings: CIPS 2008

Pages: 5Language: englishTyp: PDF

Personal VDE Members are entitled to a 10% discount on this title

Wernicke, Thies; Middendorf, Andreas; Dieckerhoff, Sibylle; Reichl, Herbert (Berlin Institute of Technology)
Guttowski, Stephan (Fraunhofer Institute for Reliability and Microintegration)

This work describes methods to determine ageing of IGBT power semiconductor modules. The relevant parameters for fatigue during operation are identified. Based on a standard model for end-of-life prediction of IGBT modules, a method for on-line estimation of deterioration under normal operation conditions is proposed. A test system to evaluate the proposed methods predicting power module degradation is presented.