Integrated Scenario for Machine-Aided Inventory Using Ambient Sensors
Conference: RFID SysTech 2008 - 4th European Workshop on RFID Systems and Technologies
06/10/2008 - 06/11/2008 at Freiburg, Germany
Proceedings: RFID SysTech 2008
Pages: 8Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Schairer, Timo; Weiss, Christian; Vorst, Philipp; Sommer, Jürgen; Hoene, Christian; Rosenstiel, Wolfgang; Straßer, Wolfgang; Zell, Andreas; Carle, Georg (Computer Science Department, University of Tübingen, Tübingen, Germany)
Schneider, Patrick; Weisbecker, Anette (IAT, University of Stuttgart, Stuttgart, Germany)
We present a novel complete system for machine-aided inventory. Our system covers automatic product identification using RFID, localization based on ambient sensors, the enrichment of raw RFID data with product information from ERP (Enterprise Resource Planning) backend systems and real-time augmented reality (AR) visualization. We have integrated all of these components into a real-world demonstrator resembling a supermarket and successfully presented the system in the scope of an industry workshop.