Characterization of Reconfigurable LC-Reflectarrays Using Near-Field Measurements
Conference: GeMiC 2009 - German Microwave Conference
03/16/2009 - 03/18/2009 at München, Germany
Proceedings: GeMiC 2009
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Dieter, Sabine; Menzel, Wolfgang (Institute of Microwave Techniques, University of Ulm, Ulm, Germany)
Moessinger, Alexander; Mueller, Stefan; Jakoby, Rolf (Department of Microwave Engineering, Technische Universität Darmstadt, Darmstadt, Germany)
A new measurement method for characterization of liquid crystal reflectarrays (LC) is presented. The phase and amplitude characteristics are determined by near-field measurements close to the antenna surface, using high resolution probes, which have been developed to resolve individual patches on the reflectarray. Measurement results showed a phase angle range of 280deg of individual detected LC patches. The measurement setup and corresponding measurement results at 35 GHz are presented. The procedure used for measurement automation is also explained.