Path Loss Pattern Prediction in Tokyo City Based on Deterministic Ray Tracing and Stochastic Multi- Parametric Approaches

Conference: EuCAP 2009 - 3rd European Conference on Antennas and Propagation
03/23/2009 - 03/27/2009 at Berlin, Germany

Proceedings: EuCAP 2009

Pages: 5Language: englishTyp: PDF

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Blaunstein, N. (Department of Communication Systems, Ben-Gurion University of the Negev, Be'er-Sheva, Israel)
Katz, D. (Department of Electrical and Computer Engineering, Ben-Gurion University of the Negev, Be'er-Sheva, Israel)
Hayakawa, M.; Sanoh, Y. (Department of Electronic Engineering, University of Electro-Communications, Tokyo, Japan)

This study is related to investigation of two planning tools based on the deterministic ray tracing model, as direct computations of numerous rays arriving at the receiver, and the stochastic multi-parametric model, as combination of statistical description of the built-up rough terrain, and of radio propagation accounting for multiple reflection, scattering and diffraction. Comparison between these two theoretical predictors is done for description of the total path loss pattern in urban environment and is shown that simple engineering formulas, obtained from the stochastic multi-parametric model, have vivid physical and mathematical form converted in the "straight line" equations.