Rapid Method for Finding Faulty Elements in Antenna Arrays Using Far Field Pattern Samples
Conference: EuCAP 2009 - 3rd European Conference on Antennas and Propagation
03/23/2009 - 03/27/2009 at Berlin, Germany
Proceedings: EuCAP 2009
Pages: 5Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Rodríguez-González, J. A.; Ares-Pena, F. (Dept. of Applied Physics, Univ. Of Santiago de Compostela, 15782 Santiago de Compostela, Spain)
Fernández-Delgado, M.; Iglesias, R.; Barro, S. (Dept. of Electronics and Computer Science, Univ. Of Santiago de Compostela, 15782 Santiago de Compostela, Spain)
A simple and fast technique that allows a diagnosis of faulty elements in antenna arrays, that only needs to consider a small number of samples of its degraded far-field pattern is described. The method tabulates patterns radiated by the array with 1 faulty element only. Then the pattern corresponding to the configuration of failed/unfailed elements under test is calculated using the error-free pattern and the patterns with 1 faulty element. The configuration with the lowest difference between the calculated and the degraded patterns is selected. Comparison of the performance of this method using an exhaustive search and a genetic algorithm for an equispaced linear array of 100 λ/2-dipoles is shown. Mutual coupling as well as noise/measurement errors in the pattern samples was considered in the numerical analysis.