Robustness Optimization of MEMS-Based Reflectarray Phase-Shifting Cells
Conference: EuCAP 2009 - 3rd European Conference on Antennas and Propagation
03/23/2009 - 03/27/2009 at Berlin, Germany
Proceedings: EuCAP 2009
Pages: 5Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Salti, Hassan; Fourn, Erwan; Gillard, Raphael (Institute of Electronics and Telecommunications of Rennes IETR, INSA of Rennes, 20, Av. des Buttes de Coesmes, 35043 Rennes Cedex, France)
Legay, Hervé (Thales Alenia Space, 26, Av. Jean François Champollion, 31037 Toulouse Cedex 1, France)
This paper proposes a design procedure for optimizing MEMS-based phase-shifting cells for reflectarrays. A quantitative factor, named Cumulative Root Mean Square Error, is used to quantify the average phase error resulting from random MEMS breakdowns in the cell. It permits to assess the cell robustness to MEMS failure and provides a convenient means of comparing different possible cell’s topologies. As an illustration, it is used to minimize the number of MEMS in the cell while preserving the necessary redundancy to limit phase errors.