Circuit Fault Diagnosis Based on Wavelet Packet and Neural Network
Conference: ISTET 2009 - VXV International Symposium on Theoretical Engineering
06/22/2009 - 06/24/2009 at Lübeck, Germany
Proceedings: ISTET 2009
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Kuczynski, Andrzej; Ossowski, Marek (Technical University of Lodz)
In this paper, neural network algorithms of fault diagnosis for analog circuit containing MOS transistors are presented. Measurement of dynamic supply current is utilized for detecting the catastrophic faults. A discrete wavelet transform is used as preprocessor in order to reduce the nodes in input layer and hidden layer of BP neural network. The illustrative numerical examples are presented.