Metallic Line Testing Solution for Next Generation Networks
Conference: WTC - World Telecommunications Congress 2010 - Telecommunications: The Infrastructure for the 21st Century
09/13/2010 - 09/14/2010 at Vienna, Austria
Proceedings: WTC - World Telecommunications Congress 2010
Pages: 5Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Noessing, Gerhard; Canella, Alberto; Trautmann, Steffen (Lantiq A GmbH, Villach, Austria)
In this paper an integrated DSL-friendly hardware solution is proposed for Metallic Line Testing (MELT) and wetting current functionality in an All Digital Loop (ADL) environment, where metallic access to the line in terms of POTS hardware or dedicated test heads for line testing is no longer available. Starting with state-of-the-art line testing for access networks, the importance of MELT as an indispensible part of a complete, reliable line testing solution is emphasized. The underlying network model required to determine the MELT parameters is introduced and typical error cases explained in detail. The network maintenance requirements for useful MELT integration are discussed and an overview of the current state of MELT standardization given. Finally, a MELT solution, which is G.lt (G.992.2) standard-compliant, is introduced briefly.