Performance and Reliability Investigations of Waveguide-Integrated Photodetectors
Conference: IPRM 2011 - 23th International Conference on Indium Phosphide and Related Materials
05/22/2011 - 05/26/2011 at Berlin, Germany
Proceedings: IPRM 2011
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Kroh, Marcel; Beling, Andreas; Trommer, Dirk; Margraf, Michael; Unterbörsch, Günter (u2t Photonics AG, Reuchlinstr. 10/11, 10553 Berlin, Germany)
The reliability of 50 GHz waveguide-integrated photodetectors is studied under accelerated aging in standard high temperature tests and in additional reliability tests applying high optical input power onto the photodetectors. Based on the experimental data we determined lifetimes exceeding the requirements of telecom operators. No measureable performance degradation was found after 2000 hours high-temperature high-power stress conditions.