Fast and Accurate Soft Error Rate Estimation at RTL level
Conference: Zuverlässigkeit und Entwurf - 5. GI/GMM/ITG-Fachtagung
09/27/2011 - 09/29/2011 at Hamburg-Harburg, Deutschland
Proceedings: Zuverlässigkeit und Entwurf
Pages: 2Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Chen, Liang; Firouzi, Farshad; Kiamehr, Saman; Tahoori, Mehdi B. (Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany)
Soft errors induced by radiation have become one of the most challenging issues that impact the reliability of modern electronic systems. In this paper we propose a register level Soft Error Rate (SER) estimation approach. It is based on analytical Error Propagation Probabilities (EPP) computation between different Register Transfer Level (RTL) building blocks in the high level Data Flow Graphs (DFG). The simulation results on a set of DFG benchmarks, compared with the traditional bit-level Statistical Fault Injection (SFI), show that our method can achieve 7 orders of magnitude speedup, with less than 9% inaccuracy on average.