A Real-Time Test Environment for High Speed Data Converters

Conference: PRIME 2012 - 8th Conference on Ph.D. Research in Microelectronics & Electronics
06/12/2012 - 06/15/2012 at Aachen, Germany

Proceedings: PRIME 2012

Pages: 4Language: englishTyp: PDF

Personal VDE Members are entitled to a 10% discount on this title

Lang, Felix; Ferenci, Damir; Alpert, Thomas; Kathmann, Thomas; Faul, Alexander; Grazing, Markus; Berroth, Manfred (Institute of Electrical and Optical Commmrications Engineering, University of Stuttgart, Pfaffenwaldring 47, 70569 Stuttgart)

A test environment for real-time measurements of high speed ADCs is presented. It is capable of handling and synchronizing 20 parallel channels with data rates of up to 6.5 GbiUs on each channel. The whole environment consists of the DUT which is mounted on a ceramic substrate, an FPGA with fast serial interfaces and a software control and analysis tool. Index Terms - Integrated circuit measurements, Measurement technique, Field programmable gate arrays (FPGA), Analog-digital conversion