An Automated Parameter Extraction Framework for Functional Verification of Mixed-Signal SoCs
Conference: PRIME 2012 - 8th Conference on Ph.D. Research in Microelectronics & Electronics
06/12/2012 - 06/15/2012 at Aachen, Germany
Proceedings: PRIME 2012
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Schleyer, Martin; Wang, Yifan; Heinen, Stefan (Chair of Integrated Analog Circuits and RF Systems, RWTH Aachen University, Sommerfeldstrasse 24, 52074 Aachen, Germany)
This work presents a novel parameter extraction & update approach to assist functional verification of complex mixed-signal SoCs. With the automated parameter extraction framework model parameters for behavioral models can be extracted from circuit simulations and stored in an external database. An extended update feature allows to update the model parameters directly in the verification environment. The approach is applied to a complex base-band filter which is part of a low power low-IF RF transceiver front-end implemented in a 130 nm CMOS technology.