Clustering Phenomena of Coupled Chaotic Circuits for Large Scale Networks
Conference: NDES 2012 - Nonlinear Dynamics of Electronic Systems
07/11/2012 - 07/13/2012 at Wolfenbüttel, Germany
Proceedings: NDES 2012
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Takamaru, Yuji; Uwate, Yoko; Nishio, Yoshifumi (Dept. of Electrical and Electronic Engineering, Tokushima University, 2-1 Minami-Josanjima, Tokushima, 770-8506, Japan)
Ott, Thomas (Institute of Applied Simulation, Zurich University of Applied Sciences, Einsiedlerstrasse 31a, 8820 Waedenswil, Switzerland)
In this study, we investigate the clustering phenomena observed from coupled chaotic circuits arranged in irregular 2-dimensional and 3-dimensional networks. The networks are fully coupled using the distance information, i.e. the coupling strength decreases with the distance between the circuits. We show that synchronized clusters can emerge, reflecting groups of neighboring circuits. By means of computer simulations, we study the clustering phenomena and confirm that the number of clusters depends on the scaling of the coupling strength. Furthermore, we study large scale and 3-dimensional networks of coupled chaotic circuits, demonstrating that clustering can also occur in more complex situations.