Logic Self Repair Architecture with Self Test Capabilities
Conference: Zuverlässigkeit und Entwurf - 6. GMM/GI/ITG-Fachtagung
09/25/0000 - 09/27/2012 at Bremen, Deutschland
Proceedings: Zuverlässigkeit und Entwurf
Pages: 7Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Koal, Tobias; Ulbricht, Markus; Vierhaus, Heinrich T. (Computer Engineering Group, Brandenburg University of Technology Cottbus, Germany)
Engelke, Piet (Infineon Technologies AG, Neubiberg, Germany)
Large-scale integrated systems fabricated in nano-technologies are harmed by specific fault effects, which may limit system reliability on one hand and system lifetime on the other side. Repair technologies may serve to compensate wear-out induced flaws by the introduction of spare resources. Repair technologies, however, must be effective in terms of redundancy allocation on one side and additional administrative overhead on the other hand. Furthermore, self repairing systems must perform test and fault diagnosis in an effective way. An advanced architecture is introduced, which may even serve to use redundant resources selectively for fault detection and fast compensation.