A New Rainflow – free Method to Transfer Irregular Load Mission Profile Data Into appropriate Lab Test Conditions for Design Optimization
Conference: CIPS 2014 - 8th International Conference on Integrated Power Electronics Systems
02/25/2014 - 02/27/2014 at Nuremberg, Germany
Proceedings: ETG-Fb. 141: CIPS 2014
Pages: 6Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Aal, Andreas (Electronic Analysis / Robustness (EEIP/1), Volkswagen AG, Berliner Ring 2, 38436 Wolfsburg, Germany)
This work presents a new design optimization process within the PoF (physics of failure) philosophy. The approach contains a FIFO (first in first out) shift register like MP (mission profile) analysis methodology which is different form usual Rainflow-histogram based approaches. It transforms MPs into a multi - stress vector domain that can be applied to concurrent independent and dependent (one degradation mode affects the other one) cumulative damage lifetime models. This methodology can lead to improved and more accurate lifetime requirement management as well as to robustness margin evaluation during design and qualification (incorporation of Monte-Carlo and Bootstrap methods).