Characterisation of low loss dielectrics using a transmission line method
Conference: GeMiC 2014 - German Microwave Conference
03/10/2014 - 03/12/2014 at Aachen, Germany
Proceedings: ITG-Fb. 246: GeMiC 2014
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Monka, Carsten; Schoebel, Joerg (Institut fuer Hochfrequenztechnik, Microwave Engineering Lab, Technische Universitaet Braunschweig, Braunschweig, Germany)
This paper discusses typical difficulties arising when using a transmission line method for the characterisation of low loss dielectrics. The impact of issues such as VNA measurement uncertainty and finite waveguide conductivity is illustrated for measurements of PTFE samples. It is shown that VNA measurement uncertainty impedes reliable loss tangent measurements for low loss dielectrics.