Risk Assessment on Defects in GIS Based on PD Diagnostics
Conference: Diagnostik elektrischer Betriebsmittel 2014 - Beiträge der 6. ETG-Fachtagung
11/25/2014 - 11/26/2014 at Berlin, Deutschland
Proceedings: Diagnostik elektrischer Betriebsmittel 2014
Pages: 7Language: englishTyp: PDF
Personal VDE Members are entitled to a 10% discount on this title
Authors:
Schichler, Uwe (Graz University of Technology, Graz, Austria)
Koltunowicz, Wojciech (OMICRON Energy Solutions, Berlin, Germany)
Endo, Fumihiro (EcoTopia Science Institute, Nagoya University, Nagoya, Japan)
Feser, Kurt; Tenbohlen, Stephan (Technical University Stuttgart, Stuttgart, Germany)
Giboulet, Andre (Consultant, France)
Girodet, Alain (Supergrid Institute, Lyon, France)
Hama, Hiroyuki (Mitsubishi Electric Corporation T&D Systems Centre, Amagasaki, Japan)
Hampton, Brian; Pearson, John (Qualitrol/DMS, Glasgow, United Kingdom)
Kranz, Hans-Gerd (Bergische Universität GH Wuppertal, Wuppertal, Germany)
Lopez-Roldan, Jose (PowerLink, Brisbane, Australia)
Lundgaard, Lars (Sintef, Trondheim, Norway)
Meijer, Sander (DNV GL, Arnhem, The Netherlands)
Neumann, Claus (CN Power Engineering Consult, Essen, Germany)
Okabe, Shigemitsu (Tokyo Electric Power Company, Yokohama, Japan)
Pietsch, Ralf (HighVolt, Dresden, Germany)
Riechert, Uwe (ABB Switzerland Ltd., High Voltage Products, Zurich, Switzerland)
Abstract:
The paper, prepared by CIGRE WG D1.03 (TF 09), presents the guidelines for risk assessment procedure on defects in GIS based on PD diagnostics. The procedure, described in detail in CIGRE Technical Brochure 525, starts with sensitive PD measurement to detect the critical defects and follows with identification of the type of the defect and its location inside the GIS. This information taken together with other essential data from laboratory measurements, manufacturer's experience, design aspects and trend analysis of the PD activity, are the base for the estimation of the criticality of the defects. Finally, the risk assessment is performed based on the estimated dielectric failure probability and failure consequences that can be different in case of on-site testing or in service activity.