Concept and First Example of TanDEM-X High-resolution DEM
Conference: EUSAR 2016 - 11th European Conference on Synthetic Aperture Radar
06/06/2016 - 06/09/2016 at Hamburg, Germany
Proceedings: EUSAR 2016
Pages: 4Language: englishTyp: PDF
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Authors:
Wessel, Birgit; Breunig, Markus; Huber, Martin (German Remote Sensing Center (DFD), German Aerospace Center (DLR), Oberpfaffenhofen, 82234 Wessling, Germany)
Bachmann, Markus; Martone, Michele; Zink, Manfred (Microwaves and Radar Institute (HR), German Aerospace Center (DLR), Oberpfaffenhofen, 82234 Wessling, Germany)
Lachaise, Marie; Fritz, Thomas (German Remote Sensing Center (IMF), German Aerospace Center (DLR), Oberpfaffenhofen, 82234 Wessling, Germany)
Abstract:
While operational data acquisition for the TanDEM-X DEM took place from 2011 to early 2015, the availability of the final DEM version on global scale is expected for autumn 2016. A next milestone, however, is the data acquisition for the upcoming so-called high-resolution DEM (HDEM) product which is being performed since spring 2015. The TanDEM-X HDEM will be available for selected test sites on local scale. The production process will begin in 2017. This paper gives an overview of the HDEM acquisition and processing concept and its product characteristics. Moreover, a first HDEM showcase data set has been produced verifying the expected reduction of the relative height error compared to the DEM.