Experimentally-Validated Models of On-State Voltage for Remaining Useful Life Estimation and Design for Reliability of Power Modules

Conference: CIPS 2018 - 10th International Conference on Integrated Power Electronics Systems
03/20/2018 - 03/22/2018 at Stuttgart, Deutschland

Proceedings: ETG-Fb. 156: CIPS 2018

Pages: 6Language: englishTyp: PDF

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Authors:
Degrenne, Nicolas; Mollov, Stefan (Mitsubishi Electric R&D Centre Europe, Rennes, France)

Abstract:
This paper focuses on the analysis, modeling and exploitation of the on-state voltage Von in wire-bonded power modules. Power cycling tests are performed until complete wire-bond failure. The evolution of Von is modeled both prior and during wire-bond lift-off. The evolution of Von reveals information concerning the strength and the state of heath of the device. The models are used for remaining useful life (RUL) estimation and design for reliability.