On-line Surveillance Techniques for Reliable Active Pixel Sensor Systems

Abstract:
In this work we present a cross layer approach for an on-line monitoring scheme of active pixel sensors which can be utilized in order to ensure a reliable system performance. The method is based on monitoring structures attached to the crucial subsystems providing status flag. These flags are used within an inpainting algorithm restoring the corrupted data with error rates under 10% for irradiated sensors after 30 years operating time. The main objective is to abstract the aging behavior of single transistors in a way so that millions of pixels can be computed in order to reconstruct a whole picture and not focusing on single defects.