Design of an EMC-improved Regulated Charge Pump in 180-nm CMOS technology
Conference: ANALOG 2018 - 16. GMM/ITG-Fachtagung
09/13/2018 - 09/14/2018 at München/Neubiberg, Deutschland
Proceedings: GMM-Fb. 91: ANALOG 2018
Pages: 4Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Nuernbergk, Dirk M.; Lang, Christian; Petri, Viktor; Frey, Micheal (Melexis GmbH, Erfurt, Konrad-Zuse-Str. 15, 99099 Erfurt, Germany)
The charge pump is a critical block for the electromagnetic compatibility of an IC in motor driver applications. We present a new and simple regulation concept of a charge pump, which can work in continuous and discontinuous mode of operation. It will be shown in this paper that the continous and discontinuous mode have different EMC performance. The charge pump has a chaotic switching behavior in this case and this effect spreads the emitted power across a wider range of frequencies. The concept of the charge pump is presented and is discussed in detail. Measurement results are shown for a charge pump realized in a 180 nm CMOS technology in the continous mode.