A Novel Automated NFC Interoperability Test and Debug System
Conference: Smart SysTech 2019 - European Conference on Smart Objects, Systems and Technologies
06/04/2019 - 06/05/2019 at Munich, Germany
Proceedings: ITG-Fb. 289: Smart SysTech 2019
Pages: 8Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Erb, Martin; Steger, Christian; Troyer, Martin (Institute of Technical Informatics, Graz University of Technology, Austria)
Preishuber-Pfluegl, Josef (CISC Semiconductor GmbH, Klagenfurt, Austria)
In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of- the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.