Double pulse vs. indirect measurement: Characterizing switching losses of integrated power modules with wide bandgap semiconductors
Conference: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
03/24/2020 - 03/26/2020 at Berlin, Deutschland
Proceedings: ETG-Fb. 161: CIPS 2020
Pages: 8Language: englishTyp: PDF
Kuczmik, Adam (Ingenieurbüro Kuczmik, Berlin, Germany)
Hoffmann, Stefan; Hoene, Eckart (Fraunhofer IZM, Berlin, Germany)
To optimize power electronic systems, the characterization of switching losses is very important. When using wide bandgap (WBG) semiconductors, this becomes more difficult with the standard measurement method due to high switching speeds. This paper discusses feasible measurement methods to determine switching losses of integrated power modules with fast switching semiconductors with high accuracy. The limits of the classical double pulse method are identified and where errors occur are analyzed. Furthermore, indirect switching loss measurement methods are described which have no disturbing effect on the switching cell. A circuit model is presented allowing to calculate switching losses from datasheet parameters.