Reliability of Capacitors and Magnetic Components in Power Electronic Applications

Conference: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
03/24/2020 - 03/26/2020 at Berlin, Deutschland

Proceedings: ETG-Fb. 161: CIPS 2020

Pages: 6Language: englishTyp: PDF

Wang, Huai; Wang, Haoran; Shen, Zhan (Aalborg University, Aalborg, Denmark)

This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented based on the state-of-the-arts.