Power cycling close to 50- Hz load, low temperature swings combined with an adjustable part of switching losses

Conference: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
03/24/2020 - 03/26/2020 at Berlin, Deutschland

Proceedings: ETG-Fb. 161: CIPS 2020

Pages: 6Language: englishTyp: PDF

Seidel, Peter; Schwabe, Christian; Lutz, Josef (Department of Power Electronics and EMC, University of Technology, Chemnitz, Germany)

Power cycling tests with low temperature swings are interesting for a lot of users, because often many of them occur in the application. However, most manufacturers and lifetime models cannot make a statement about the range in which a temperature swing leads to permanent damage (plastic strain) or only to reversible deformation (elastic strain). In this work, a power cycling test with superimposed switching losses is intended to investigate the area where both mechanisms have an impact on the lifetime and which dependencies can be detected. Furthermore, a simulation will be performed to detect the influence of plastic and elastic strain in the bond interconnection regarding lifetime.