A Fast Source to Drain Voltage Measurement in Bridge Topologies Using a Freewheeling Path for Dynamic Power Cycling Tests
Conference: CIPS 2024 - 13th International Conference on Integrated Power Electronics Systems
03/12/2024 - 03/14/2024 at Düsseldorf, Germany
Proceedings: ETG-Fb. 173: CIPS 2024
Pages: 7Language: englishTyp: PDF
Authors:
Baron, Kevin Munoz; Swaroop Dash, Sarthak; Solomakha, Oleksandr; Kallfass, Ingmar (Institute of Robust Power Semiconductor Systems, University of Stuttgart, Germany)
Abstract:
Temperature monitoring in power cycling tests is crucial for the comprehensive evaluation of the reliability of semiconductor devices as it has a major influence on the results. This can be achieved by using the forward voltage drop of the body diode of a MOSFET known as the