Design of a Test Assembly for Evaluation of a Transimpedance Amplifier IC and Performance Optimization
Conference: ANALOG '05 - 8. GMM/ITG-Diskussionssitzung: Entwicklung von Analogschaltungen mit CAE-Methoden
03/16/2005 - 03/18/2005 at Hannover, Deutschland
Proceedings: ANALOG '05
Pages: 5Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Muth, Karlheinz; Gelhausen, Frank; Braier, Martin; Schuppener, Gerd (Texas Instruments Deutschland GmbH, HPA Hannover R&D, 30855 Langenhagen, Germany)
This paper presents a test assembly for electrical evaluation of a Transimpedance Amplifier (TIA) to be used in fiber-optical communication link. The assembly allows the use of conventional microwave measurement equipment for characterization instead of optical measurement equipment. The influence of pad layout arrangement and of bond wire coupling when mounting the die on either a Printed Circuit Board (PCB) or in a TO-can has been studied. It is shown that asymmetry in the mounting can severely deteriorate the overall circuit performance. The recommendations for assembly as proposed by simulations could be verified by measurements.