A Compact Multi-Tone Test Generator for RF ICs Using a Σ Δ-PLL

Conference: ANALOG '05 - 8. GMM/ITG-Diskussionssitzung: Entwicklung von Analogschaltungen mit CAE-Methoden
03/16/2005 - 03/18/2005 at Hannover, Deutschland

Proceedings: ANALOG '05

Pages: 4Language: englishTyp: PDF

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Münker, Christian (Infineon Technologies AG, PO Box 80 09 49, 81609 München, Germany)

A new approach to adding built-in self test (BIST) capabilities to integrated RF transceiver chips is presented. An area efficient, all-digital building block generates multitone FM test signals in conjunction with a fractional-N phase locked loop without compromising the performance of the RF transceiver. The block itself is fully testable and consumes a chip area of only 0.015mm2 in a 130nm CMOS technology. The spectral quality and reproducibility of the test signals are suitable for intermodulation distortion tests or PLL loop and jitter transfer measurements.