A Pseudo-Random Data Generator for Program-Based DDR DRAM BIST with Custom Defined Testing Algorithms
Conference: Zuverlässigkeit und Entwurf - 1. GMM/GI/ITG-Fachtagung
03/26/2007 - 03/28/2007 at München, Germany
Proceedings: Zuverlässigkeit und Entwurf
Pages: 2Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Li, Hongzhi (Qimonda AG, Am Campeon 1-12, D85576 Neubiberg, Germany)
The aim of this work is to develop a pseudo-random data generator for program-based DRAM Built-In Self Test (BIST) technology which is finally applied to the verification of DIMM modules. The requirements to meet dedicated DDR DRAM BIST applications are analysed and the implementation of a suitable random data generator is discussed. The proposed methodology has been finally verified by the hardware implementation and lab testing.