Investigation of Waveguide Mode Profile Using Low Coherent Interferometric Method
Conference: ECOC 2007 - 33rd European Conference and Exhibition of Optical Communication
09/16/2007 - 09/20/2007 at Berlin, Germany
Proceedings: ECOC 2007
Pages: 2Language: englishTyp: PDFPersonal VDE Members are entitled to a 10% discount on this title
Wang, Zhipeng; Chen, Yung Jui (Ray) (CSEE Department, University of Maryland Baltimore County, USA)
We demonstrate for the first time a waveguide mode profile characterization scheme in an AWG, utilizing low coherent interferometric measurement. The technique is very effective in characterizing input waveguide design in advanced AWG devices.